Contents
Home
Profile
Public Work
Refereed Journals
Presentaions
Private
Photo
Access Log
Links
Login
Simulation Study for the Higher Sensitivity of an Electron-Tracking Compton Camera at over 1 MeV
Infomation
Conference
2011 IEEE Nuclear Science Symposium and Medical Imaging Conference
Place
Valencia, Spain
Date
2011/10
Type
Poster
View
499
Links
関連URL
IEEE NSS
atakada_root
poster
atakada_root
Proceeding
atakada_root